KIC

KIC provides advanced solutions for reflow, cure, and wave profiling, machine tracking, and automatic profiling and inspection for high-reliability electronics manufacturing. At Booth 2702, KIC will demonstrate its Thermal Analysis System™ with OEE-enabled Common Recipe Finder™, using AI-driven prediction to identify optimal oven recipes. Recipe optimization and automatic profiling enable faster NPI, higher throughput, improved quality and reliability, traceability, audit-ready reporting, and strong process control. HeatMap™ adds real-time oven performance monitoring with profiler integration.